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Semiconductor Inspection

Controlling the spatial, spectral and temporal characteristics of light is becoming increasingly important for defect analysis and device testing in semiconductor manufacturing. Microscope arc lamps and incandescent bulbs are encumbered by limited operating lifetimes and lack flexibility for incorporation in modular design frameworks. Instrumentation designers, engineers, and manufacturers are turning to Lumencor’s solid-state illumination technologies for sustainable, high-performance solutions and robustly manufactured products.